Abstract: In this work, time-dependent gate reliability studies were carried out on GaN high-electron-mobilitytransistors (HEMTs) under continuous DC gate bias ($\mathrm{V}_{\mathrm{GS}}$) and ...
Abstract: Wireless cable is a promising solution for testing highly integrated multiple-input multiple-output (MIMO) devices in an over-the-air (OTA) manner. It has attracted significant attention ...
More than two dozen neurodegenerative diseases, including Alzheimer's disease and Chronic Traumatic Encephalopathy (CTE), are driven by toxic proteins called tau aggregates. New resarch illuminates ...
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