Abstract: In this paper a new approach to the yield evaluation of electronic circuits is presented. It is a divide-and-conquer algorithm based on interval arithmetic that allows one to reliably mark ...
Abstract: For long time span, various disturbing factors, randomness of medium-long term load forecasting, as well as the over-estimation of interval arithmetic, a novel medium-long term load ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results