Abstract: In this work, time-dependent gate reliability studies were carried out on GaN high-electron-mobilitytransistors (HEMTs) under continuous DC gate bias ($\mathrm{V}_{\mathrm{GS}}$) and ...
Abstract: With respect to the group consensus control for multi-agent systems (MASs) with disturbances and actuator nonidentical and unknown direction faults (NUDFs), this paper proposes a novel fault ...
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