From computers to smartphones, from smart appliances to the internet itself, the technology we use every day only exists ...
Abstract: Hot carrier injection (HCI) has been strategically leveraged to enhance the stability of SRAM physically unclonable functions (PUFs). Since the effects of HCI are not constant, exhibiting ...
Abstract: Gate oxide Dielectric Breakdown (BD) in Metal-Oxide-Semiconductor (MOS) structures is a random process, which can be exploited in cryptography applications. Here, the post-BD current in ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results