Abstract: In this work, time-dependent gate reliability studies were carried out on GaN high-electron-mobilitytransistors (HEMTs) under continuous DC gate bias ($\mathrm{V}_{\mathrm{GS}}$) and ...
Abstract: Wireless cable is a promising solution for testing highly integrated multiple-input multiple-output (MIMO) devices in an over-the-air (OTA) manner. It has attracted significant attention ...
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