Mathias Schubert, a leading figure in optical ellipsometry, has been named a 2025 National Academy of Inventors Fellow, the ...

Abstract: This work presents an overview of the latest advancements in monochromatic ellipsometry, tracing its evolution from early null ellipsometry to widely commercialized rotating ellipsometry, ...

Polarization describes the orientation of electromagnetic waves as they propagate through space, representing one of light's fundamental properties alongside wavelength and intensity. In spectroscopy, ...

Scientists measured single MXene flakes with light-based micro-ellipsometry, uncovering unique conductivity and optical traits for smarter energy and electronics. (Nanowerk News) Researchers have for ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

Researchers typically use Raman spectroscopy to check the structural quality and thickness of graphene, but because the technique can only cover a small area in a given time, it’s painfully slow. It ...

Polarization is a fundamental property of light waves. Polarization information of the light interacted with an object can be used to reveal its physical properties of interest, such as material, ...