Abstract: Fault diagnosis is a key technology to improve the reliability of electrical machine systems. However, no previous research has addressed open-circuit (OC) faults in the power switches of ...

It’s time to “get back to basics” in math, Gov. Kathy Hochul says as she calls for sensible curricular and instruction changes. She’s right; too bad she has zero power over New York’s education ...

Abstract: The mechanism of reverse recovery failure in the lateral integrated Bootstrap Diode (BST-Diode) is investigated through physical TCAD simulation in this paper. It is found that the crowding ...