Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Understanding connectivity issues and interactions are only part of the problem; ECOs can cause unexpected problems in other ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Engineers could avoid expensive redesigns by planning medical device testing early in development with expert guidance.

In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...

Virtual system integration and test using Model-Based Design uncovers errors introduced in the requirements and design phases of embedded system development, well before the physical testing phase. As ...